NMX-J-191 Heat Deformation of Semiconductive Shielding, Insulations and Protective Coverings of Electrical Conductors – Test Method
5.1.3 Deformation 5.1.3.1 Insulation The insulation on single-conductor wires, and on the individual conductors (separated, in the case of parallel cords), shall not decrease by more than 50% in thickness when subjected to a force caused by a mass as shown in Table 40, and while maintained at the temperature shown in Table 40 for 1 h. 5.1.3.2 Jacket Smoothed specimens of jackets from finished cords and cables shall not decrease by more than 50% in thickness when subjected to a force caused by a mass of 2000 g, and while maintained at the temperature shown in Table 40 for 1 h. 5.1.3.3 Method Compliance with Clauses 5.1.3.1 and 5.1.3.2 shall be determined in accordance with the method described in CSA C22.2 No. 0.3, Clause 4.3.6.1; UL 1581, Section 560; or NMX-J-191-ANCE.